Journal papers

Home > Publications > Journal papers

  • 12 S.-J. Choi, P. Bennett, D. Lee, and J. Bokor "Highly uniform carbon nanotube nanomesh network transistors" Nano research, vol.8, pp 1320-1326, 2014-12
  • 11 J. Yoon, D. Lee, C. Kim, J. Lee, B. Choi, D. M. Kim, D. H. Kim, M. Lee, Y.-K. Choi, and S.-J. Choi "Accurate extraction of mobility in carbon nanotube network transistors using C-V and IV measurements" Applied Physics Letters, vol. 105, p. 212103, 2014-11
  • 10 J. Jang, D. G. Kim, D. M. Kim, S.-J. Choi, J.-H. Lim, J.-H. Lee, Y.-S. Kim, B. D. Ahn, and D. H. Kim "Investigation on the negative bias illumination stress-induced instability of amorphous indium-tin-zinc-oxide thin film transistors" Applied Physics Letters, vol. 105, p. 152108, 2014-10
  • 9 E. K.-H. Yu, S. Jun, D. H. Kim, and J. Kanicki "Density of states of amorphous In-Ga-Zn-O from electrical and optical characterization" J. Appl. Phys., vol. 116. 154505 -1-6, 2014-10
  • 8 H. Bae, H. Seo, S. Jun, H. Choi, J. Ahn, J. Hwang, J. Lee, S. Oh, J.-U. Bae, S.-J. Choi, D. H. Kim, and D. M. Kim "Fully Current-Based Sub-Bandgap Optoelectronic Differential Ideality Factor Technique and Extraction of Subgap DOS in Amorphous Semiconductor TFTs" IEEE Transactions on Electron Devices, vol. 61. no. 10. pp, 3566 - 3569, 2014-10
  • 7 J. C. Park, I.-T. Cho, E.-S. Cho, D. H. Kim, C.-Y. Jeong, and H.-I. Kwon "Comparative Study of ZrO2 and HfO2 as a High-k Dielectric for Amorphous InGaZnO Thin Film Transistors" Journal of Nanoelectronics and Optoelectronics, vol. 9, pp. 67-70, 2014-02
  • 6 J. Lee, B. Choi, S. Hwang, J. H. Lee, B.-G. Park, T. J. Park, D. M. Kim, D. H. Kim, and S.-J. Choi "Investigation of Sensor Performance in Accumulation- and Inversion-Mode Silicon Nanowire pH Sensors" IEEE Transactions on Electron Devices, vol. 61. no. 5, pp. 1607-1610, 2014-05
  • 5 D. Lee, M.-L. Seol, D.-I. Moon, P. Bennett, N. Yoder, J. Humes, J. Bokor, Y.-K. Choi and S.-J. Choi "High-performance thin-film transistors produced from highly separated solution-processed carbon nanotubes" Applied Physics Letters, vol. 104, p. 143508, 2014-04
  • 4 S.-M. Joe, J.-H. Bae, C. H. Park, and J.-H. Lee "Modeling of ΔIBL due to random telegraph noise with considering bit-line interference in NAND flash memory" Semiconductor Science and Technology, vol. 29, no. 12, p. 125013, doi: 10.1088/0268-1242/29/12/125013, 2014-11
  • 3 W. H. Lee, J.-M. Lee, M. Uhm, J. Lee, K. R. Kim, S.-J. Choi, D. M. Kim, Y.-J. Jeong and D. H. Kim "Characterization and Capacitive Modeling of Target Concentration-Dependent Subthreshold Swing in Silicon Nanoribbon Biosensors" IEEE Electron Device Letters, vol. 35. no. 5, pp. 587-589, 2014-05
  • 2 G. Kim, E. Park, J. H. Kim, J.-H. Bae, D. H. Kang, and B.-G. Park "Analysis of trap and its impact on InGaN-based blue light-emitting diodes using current-transient methodology" Japanese Journal of Applied Physics, vol. 53, no. 6, p. 062101, doi: 0.7567/JJAP.53.062101, 2014-05
  • 1 J. Lee, J. Jang, H. Kim, J. Lee, B. L. Lee, S.-J. Choi, D. M. Kim, D. H. Kim, and K. R. Kim "Physical Origins and Analysis of Negative-Bias Stress Instability Mechanism in Polymer-Based Thin-Film Transistors" IEEE Electron Device Letters, vol. 35, no. 3, pp. 396-398, 2014-02