Journal papers

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  • 388 J. T. Jang, D. Ko, S. -J. Choi, D. M. Kim, and *D. H. Kim(* Corresponding author) "Observation of Hydrogen-related Defect in Subgap Density of States and Its Effects under Positive Bias Stress in amorphous InGaZnO TFT" IEEE Electron Device Letters, doi: 10.1109/LED.2021.3066624., 2021-03
  • 387 J. -H. Kim, J. T. Jang, J. -H. Bae, S. -J. Choi, D. M. Kim, C. Kim, Y. Kim 3,* and D. H. Kim*(* Corresponding author) "Analysis of Threshold Voltage Shift for Full VGS/VDS/Oxygen-Content Span under Positive Bias Stress in Bottom-Gate Amorphous InGaZnO Thin-Film Transistors" Micromachines, vol. 12, no. 3, p. 327, 2021-03
  • 386 S. Kim, D. Kwon, T. -H. Kim, T. J. Park, S. -J. Cho, H. -S. Mo, D. H. Kim, and B. -G. Park "Multiplexed Silicon Nanowire Tunnel FET-Based Biosensors With Optimized Multi-Sensing Currents" IEEE Sensors Journal, vol. 21, no. 7, pp. 8839-8846, doi: 10.1109/JSEN.2021.3054052., 2021-03
  • 385 S. Choi†, I. Chae†, J. Park, Y. Seo, C. I. Ryoo, D. M. Kim, S.-J. Choi, D.-W. Park*, and D. H. Kim*(†These authors equally contributed to this work & *co-corresponding authors) "Extraction Technique for Flat Band Voltage Using Multi-Frequency C – V Characteristics in Amorphous InGaZnO Thin-Film-Transistors" IEEE Electron Device Letters, vol. 41, no. 12, pp. 1778-1781, doi: 10.1109/LED.2020.3032442., 2020-12
  • 384 J.-T. Yu†, H. B. Yoo†, H. Kim, J. H. Ryu, S.-J. Choi, D. H. Kim, and D. M. Kim*(†These two authors contributed equally to this work) "Characterization of Spatial Distribution of Trap Across the Substrate in Metal-Insulator-Semiconductor Structure with Band Bending Effect" Journal of Nanoscience and Nanotechnology, Vol. 21, No. 8, pp. 4315-4319, DOI: 10.1166/jnn.2021.19391, 2021-08
  • 383 K. Lee, Y. Kim, H. Lee, S. Park, Y. Lee, M.-K. Joo, H. Ji, J. Lee, J. Chun, M. Sung, Y.-H. Cho, D. Kim, J. Choi, J. W. Lee, D.-Y. Jeon*, S.-J. Choi*, and G.-T. Kim* (*co-corresponding authors) "Defect spectroscopy of sidewall interfaces in gate-all-around silicon nanosheet FET" Nanotechnology, vol. 32, p. 165202, DOI: 10.1088/1361-6528/abd278, 2021-01
  • 382 Y. Lee†, J. Yoon†, Y. Kim†, D. M. Kim, D. H. Kim, and S.-J. Choi* (†These authors equally contributed to this work) "Humidity effects according to the type of carbon nanotubes" IEEE Access, vol. 9, pp. 6810-6816, DOI:10.1109/ACCESS.2020.3048173 , 2020-12
  • 381 S. Kim, Y. Lee, H.-D. Kim, and S.-J. Choi* "A tactile sensor system with sensory neurons and a perceptual synaptic network based on semivolatile carbon nanotube transistors" NPG Asia Materials, vol. 12, no. 76, pp. 1-8, DOI: 10.1038/s41427-020-00258-9, 2020-12
  • 380 J.-H. Bae, D. Kwon*, S. Cheema, A. J. Tan, C. Hu, and S. Salahuddin*, (*co-corresponding authors) "Highly Scaled, High Endurance, Ω-Gate, Nanowire Ferroelectric FET Memory Transistors" IEEE Electron Device Letters, vol. 41, no. 11, pp. 1637-1640, doi: 10.1109/LED.2020.3028339, 2020-11
  • 379 J.-H. Ahn†, B. Choi†, and S.-J. Choi* (†These authors equally contributed to this work) "Understanding the signal amplification in dual-gate FET-based biosensors" J. Appl. Phys., vol. 128, p. 184502, DOI: 10.1063/5.0010136, 2020-11
  • 378 J. T. Jang†, J. Min†, Y. Hwang, S.-J. Choi, D. M. Kim, H. Kim*, and D. H. Kim* (†These authors equally contributed to this work & *co-corresponding authors) "Digital and Analog Switching Characteristics of InGaZnO Memristor Depending on Top Electrode Material for Neuromorphic System" IEEE Access, vol. 8, pp. 192304-192311, doi: 10.1109/ACCESS.2020.3032188, 2020-10
  • 377 H. B. Yoo1, J. Yu1, H. Kim, J. H. Ryu, S.-J. Choi, D. H. Kim, and D. M. Kim* (1 Contributed equally to this work.)(*Corresponding author.) "Deep Depletion Capacitance-Voltage Technique For Spatial Distribution of Traps Across the Substrate in MOS Structures" Solid-State Electronics, 107905, 2020-10
  • 376 H. Kim, H. B. Yoo, J.-T. Yu, J. H. Ryu, S.-J. Choi , D. H. Kim, and D. M. Kim "Alternating Current-Based Technique for Separate Extraction of Parasitic Resistances in MISFETs With or Without the Body Contact" IEEE Electron Device Lett., vol. 41, no. 10, pp. 1528-1531, 2020-10
  • 375 J. T. Jang, D. Kim, W. S. Choi, S.-J. Choi, D. M. Kim, Y. Kim*, and D. H. Kim* (*co-corresponding authors) "One Transistor-Two Memristor Based on Amorphous Indium-Gallium-Zinc-Oxide for Neuromorphic Synaptic Devices" ACS Appl. Electron. Mater., vol. 2, no. 9, pp. 2837-2844, 2020-09
  • 374 J. T. Jang, H.-D. Kim, D. M. Kim, S.-J. Choi, H.-S. Kim*, and D. H. Kim* (*co-corresponding authors) "Effect of Anion Composition on the Bias Stress Stability in Zn–O–N Thin-Film Transistors" IEEE Electron Device Lett., vol. 41, no. 9, pp. 1376-1379, 2020-08
  • 373 Y. Lee, J. Yoon, H.-J. Kim, G.-H. Park, J. W. Jeon, D. H. Kim, D. M. Kim, M.-H. Kang*, and S.-J. Choi* (*co-corresponding authors) "Wafer-Scale Carbon Nanotube Network Transistors" Nanotechnology, vol. 31, no. 46, p. 465303, DOI: 10.1088/1361-6528/abac31, 2020-08
  • 372 D. Kim†, J. T. Jang†, E. Yu, J. Park, J. Min, D. M. Kim, S.-J. Choi, H.-S. Mo, S. Cho*, K. Roy, D. H. Kim* (†These authors equally contributed to this work & *co-corresponding authors) "Pd/IGZO/p+-Si Synaptic Device with Self-Graded Oxygen Concentrations for Highly Linear Weight Adjustability and Improved Energy Efficiency" ACS Appl. Electron. Mater., vol. 2, no. 8, pp. 2390-2397, 2020-07
  • 371 S. Kim, Y. Lee, H.-D. Kim, and S.-J. Choi* "16-bit Fixed-Point Number Multiplication with CNT Transistor Dot-Product Engine" IEEE Access, vol. 8, pp. 133597 - 133604, DOI: 10.1109/ACCESS.2020.3009637, 2020-07
  • 370 H. B. Yoo, S. K. Kim, J. Kim, J. Yu, S.-J. Choi, D. H. Kim, D. M. Kim "Characterization of Subgap Density-of-States by Sub-Bandgap Optical Charge Pumping in In0.53Ga0.47As Metal-Oxide-Semiconductor Field-Effect Transistors" Journal of Nanoscience and Nanotechnology, vol. 20, no. 7, pp. 4287-4291(5), 2020-07
  • 369 J. Kim, C. T. T. Huong, N. V. Long, M. Yoon, M. J. Kim, J. K. Jeong, S. Choi, D. H. Kim, C. H. Lee, S. U. Lee, and M. M. Sung "Complementary Hybrid Semiconducting Superlattices with Multiple Channels and Mutual Stabilization" Nano lett., vol. 20, pp. 4864-4871, 2020-06